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Books by Nicola, Al-Hashimi, Bashir M. Nicolici

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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) by Nicolici, Nicola, Al-Hashimi, Bashir M. (2003) Hardcover
Power-Constrained Testing of VLSI Circuits: A Guide to the …
By: Nicola, Al-Hashimi, Bashir M. Nicolici
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