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UP Media Group, Inc.
Books by Publisher: UP Media Group, Inc.
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438
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🇺🇸 United States
Total process control and management, part II: from reliabi…
By:
Paul P.E. Wang, Jorge Martinez-Vargas, Dinesh Gill, Ramamoorthy Ganapathy Iyer, Dan Kauss
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🇺🇸 United States
Validating press-fit connector installation: a winning comb…
By:
Dante Parenti, Jack Mitchell
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🇺🇸 United States
PCB design for defect-free selective soldering General guid…
By:
Unavailable
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🇺🇸 United States
Preparing for the WEEE Directive: recycling requirements fo…
By:
Kenneth S. Rivlin, Jean-Philippe Brisson, David Wharwood
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🇺🇸 United States
AOI--defining reliability for complex designs: advanced AOI…
By:
Zulki Kahn
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🇺🇸 United States
Q&A with Nicholas Brathwaite, chief technology officer,…
By:
Lisa Hamburg Bastin
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🇺🇸 United States
The return of the brainteaser interview: puzzles that chall…
By:
Ted Daywalt
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🇺🇸 United States
RCC Capacitive layers for SBU applications: thin-film polym…
By:
Rabindra N. Das, Steven G. Rosser, Konstantinos I. Papathomas, Mark D. Poliks, John M. Lauffer, Voya R. Markovich
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🇺🇸 United States
PCB signal integrity, power integrity and EMC challenges: s…
By:
Brad Brim
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🇺🇸 United States
Even small things count! Readers with questions concerning …
By:
Les Hymes
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🇺🇸 United States
IC package to PCB co-design: advances in IC packages provid…
By:
Benjamin Jordan
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🇺🇸 United States
All solder pastes are not created equal: several in-house t…
By:
Phil Zarrow
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🇺🇸 United States
NEMI Project: free model compares costs of test strategies.…
By:
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🇺🇸 United States
Improved electrolytic COPPER PLATING for Flex PWBs; a novel…
By:
Hiroshi Hoshiyama, Shinjiroh Hayashi, Makoto Sakai, Rikiya Shimizu
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🇺🇸 United States
When tactics win out: the supply chain works best when dili…
By:
Charlie Barnhart
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🇺🇸 United States
RF and PCB design: RF conductors form actual circuit compon…
By:
Mark Forbes
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🇺🇸 United States
Choosing a BGA inspection system: a review of three types o…
By:
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🇺🇸 United States
Copper plating and microvia fill for advanced PCBS: vertica…
By:
Bruce Chen
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🇺🇸 United States
The effect of placement yield on rework costs: a benchmark …
By:
Sjef Van Gastel
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🇺🇸 United States
Certifying the SMT process engineer.(Surface Mount Technolo…
By:
Phil Zarrow
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🇺🇸 United States
ESD Control in Handling and Sorting -- Even minor, and seem…
By:
Michael T. Brandt
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🇺🇸 United States
Using a printer in chip attachment and encapsulation: part …
By:
Clive Ashmore
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🇺🇸 United States
Paralleling capacitors: differences in maximum ripple curre…
By:
Mark Woolley, Jae Choi
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🇺🇸 United States
Optimizing Pb-free SMT process parameters: a Taguchi approa…
By:
Antonio Buonomo, Alessandro Lo Schiavo, Fabrizio Rotulo
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🇺🇸 United States
What role do Vias play in DfA? Proper pad-to-via clearance …
By:
W. Scott Fillebrown
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🇺🇸 United States
Printable nanocomposites: advanced materials provide a low …
By:
Rabindra N. Das, How Lin, John M. Lauffer, Michael Rowlands, Norman Card, Voya R. Markovich
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🇺🇸 United States
Playing the collective hand: ECTC attendees search for winn…
By:
E. Jan Vardaman
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🇺🇸 United States
Board-on-chip toolset ready: Altium to roll out Nexar this …
By:
Mike Buetow
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🇺🇸 United States
Automating the DDRx-interface verification process: today…
By:
Dave Kohlmeier
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🇺🇸 United States
Making the 'centigrade': how Motorola tested--and…
By:
Vahid Goudarzi, Grahame Freeman
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🇺🇸 United States
VAR breathes new life into OrCad Line.(EMA Renews Investmen…
By:
Mike Buetow
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🇺🇸 United States
3-D IC bonding: supply-chain roles are changing, with EMS f…
By:
Chris Sanders
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