Home / Publishers / Society of Photo Optical

Books by Publisher: Society of Photo Optical

All books from this publisher

2,173 books found — Page 9 of 68
All-Optical Networking: Architecture, Control, and Management Issues, 3-5 November 1998 Boston, Massachusetts (Proceedings of Spie Volume 3531)
All-Optical Networking: Architecture, Control, and Manageme…
By:
View Details
Mobile Robots XIV: Proceedings of Spie : 20-22 September 1999 Boston, Massachusetts (Spie Proceedings Series Volume 3838)
Mobile Robots XIV: Proceedings of Spie : 20-22 September 19…
By:
View Details
Mobile Robots Xiii and Intelligent Transportation Systems: Proceedings of Spie : 3-5 November 1998 Boston, Massachusetts (Spie Proceedings Series, Volume 3525)
Mobile Robots Xiii and Intelligent Transportation Systems: …
By:
View Details
Training, Education & Liability Issues for Law Enforcement Scienctists & Engineers (Proceedings / SPIE--the International Society for Optical Engineering)
Training, Education & Liability Issues for Law Enforcem…
By:
View Details
Mobile Multimedia/ Image Processing for Military and Security Applications (Proceedings of Spie)
Mobile Multimedia/ Image Processing for Military and Securi…
By:
View Details
Sources and Detectors for Fiber Communications: 8-9 September 1992 Boston, Massachusetts (Proceedings of Spie)
Sources and Detectors for Fiber Communications: 8-9 Septemb…
By:
View Details
Imaging Spectrometry (Proceedings of Spie)
Imaging Spectrometry (Proceedings of Spie)
By: Sylvia S. Shen
View Details
Micro And Nanoelectronics 2005 (Proceedings of SPIE)
Micro And Nanoelectronics 2005 (Proceedings of SPIE)
By: Kamil A. Valiev
View Details
Thermal Imaging (Proceedings of Spie)
Thermal Imaging (Proceedings of Spie)
By: Irving R. Abel
View Details
Fiber Lasers: Technology, Systems, And Applications (Proceedings of Spie)
Fiber Lasers: Technology, Systems, And Applications (Procee…
By:
View Details
Photonics for Space Environments II: Proceedings : 5-6 April 1994 Orlando, Florida (Proceedings of Spie)
Photonics for Space Environments II: Proceedings : 5-6 Apri…
By:
View Details
Mathematics of Data/ Image Pattern Recognition, Compression, and Encryption With Applications IX (Proceedings of Spie) (Pt. IX)
Mathematics of Data/ Image Pattern Recognition, Compression…
By: Gerhard X. Ritter, Mark S. Schmalz, Junior Barrera, Jaakko T. Astola
View Details
Neural, Morphological, and Stochastic Methods in Image and Signal Processing: 10-11 July, 1995, San Diego, California (Proceedings of Spie)
Neural, Morphological, and Stochastic Methods in Image and …
By:
View Details
PHOTONIC CRYSTAL MATERIALS AND DEVICES 3 (Proceedings of SPIE)
PHOTONIC CRYSTAL MATERIALS AND DEVICES 3 (Proceedings of SP…
By: Richard M. De LA Rue
View Details
Fddi, Campus-Wide, and Metropolitan Area Networks (Proceedings of Spie)
Fddi, Campus-Wide, and Metropolitan Area Networks (Proceedi…
By: K. Annamalai, Stewart K. Cudworth
View Details
Cryogenic Optical Systems and Instruments X (Proceedings of SPIE)
Cryogenic Optical Systems and Instruments X (Proceedings of…
By:
View Details
Spie Top 100 Downloads on Cd-rom: Photonic Crystal and Microstructured Fiber Devices and Applications (Top 100 Downloaded Spie Papers)
Spie Top 100 Downloads on Cd-rom: Photonic Crystal and Micr…
By:
View Details
Algorithms for Synthetic Aperture Radar Imagery 12 (Proceedings of SPIE)
Algorithms for Synthetic Aperture Radar Imagery 12 (Proceed…
By: Edmund G. Zelnio
View Details
Light-Emitting Diodes: Research, Manufacturing, and Applications IV : 26-27 January 2000 San Jose, Californai (Proceedings of Spie Vol 3938)
Light-Emitting Diodes: Research, Manufacturing, and Applica…
By:
View Details
Photonic Crystal Fibers III (Proceedings of Spie)
Photonic Crystal Fibers III (Proceedings of Spie)
By:
View Details
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2008 (Proceedings of Spie)
Sensors and Smart Structures Technologies for Civil, Mechan…
By:
View Details
Third Pacific Northwest Fiber Optic Sensor Workshop: 6-7 May 1997, Troutdale, Oregon (Spie Proceedings Series, Volume 3180)
Third Pacific Northwest Fiber Optic Sensor Workshop: 6-7 Ma…
By:
View Details
Electron-Beam, X-Ray, Euv, and Ion-Beam Submicrometer Lithographies for Manufacturing V: 20-21 February 1995 Santa Clara, California (Proceedings of ... Society for Optical Engineering, V. 2437.)
Electron-Beam, X-Ray, Euv, and Ion-Beam Submicrometer Litho…
By:
View Details
Optical Computing and Neural Networks (Proceedings of Spie)
Optical Computing and Neural Networks (Proceedings of Spie)
By: Ken Y. Hsu
View Details
Optical Thin Films: User Handbook (SPIE PRESS Monograph Vol. PM37)
Optical Thin Films: User Handbook (SPIE PRESS Monograph Vol…
By: James D. Rancourt
View Details
In-Plane Semiconductor Lasers 3 (Proceedings of Spie--the International Society for Optical Engineering, V. 3628.)
In-Plane Semiconductor Lasers 3 (Proceedings of Spie--the I…
By:
View Details
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2009 (Proceedings of Spie)
Sensors and Smart Structures Technologies for Civil, Mechan…
By:
View Details
14th Symposium on Photonic Measurements: 1-3 June 1992 Sopron, Hungary (Proceedings of Spie)
14th Symposium on Photonic Measurements: 1-3 June 1992 Sopr…
By: Hungary) Symposium on Photonic Measurements 1992 (Sopron, J. Schanda, T. Lippenyi
View Details
Physical Chemistry of Interfaces and Nanomaterials II: 6-8 August 2003 San Diego, California, USA (Proceedings of Spie Volume 5223)
Physical Chemistry of Interfaces and Nanomaterials II: 6-8 …
By:
View Details
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2007 (Proceedings of Spie)
Sensors and Smart Structures Technologies for Civil, Mechan…
By:
View Details
Recent Developments in Optical Gauge Block Metrology: 20-21 July 1998 San Diego, California (Spie Proceedings Series, Volume 3477)
Recent Developments in Optical Gauge Block Metrology: 20-21…
By:
View Details
Microsystems Engineering: Metrology and Inspection III, 23-25 June 2003 Munich, Germany (Proceedings of Spie)
Microsystems Engineering: Metrology and Inspection III, 23-…
By:
View Details