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UP Media Group, Inc.
Books by Publisher: UP Media Group, Inc.
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438
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🇺🇸 United States
Get on board: solving thermal problems at board level: the …
By:
Robin Bornoff
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🇺🇸 United States
A systematic approach to increasing layer count: increasing…
By:
John Peloso
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🇺🇸 United States
A strong framework for outsourcing: think ISO/TS 16949 is j…
By:
Jim Lanigan
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🇺🇸 United States
Spray fluxing--it's not the same old game: spray fluxi…
By:
Harvey L. Berger
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🇺🇸 United States
Effective ESD control programs: putting basic ESD principle…
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🇺🇸 United States
New angles on X-ray inspection: X-ray systems can be used i…
By:
Nick Hadland
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🇺🇸 United States
The 5 pillars to a good lean foundation: strategies for lev…
By:
Edward Basconi
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🇺🇸 United States
A new era in consumer Electronics? The iPad will please mak…
By:
E.Jan Vardaman
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🇺🇸 United States
A mass measurement system for screen printing: several expe…
By:
Richard Lieske
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🇺🇸 United States
A manufacturable lead-free surface-mount process? NEMI demo…
By:
Jasbir Bath
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🇺🇸 United States
RoHS follow up 'arbitrary and capricious,' claims…
By:
Kathy Nargi-Toth
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🇺🇸 United States
The Cluster Approach for In-Circuit and Functional Testing …
By:
Slav Ligai
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🇺🇸 United States
A 'disconnection approach' to cleaning process se…
By:
Harald Wack
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🇺🇸 United States
'There are changes every day': three EMS provider…
By:
Susan Mucha
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🇺🇸 United States
Flextronics CEO: 'pricing about to improve'. (Mul…
By:
Mike Buetow
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🇺🇸 United States
'Every tool has its place': the final part of our…
By:
Terry Munson
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🇺🇸 United States
2003 Service Excellence Award winners announced at APEX.(In…
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🇺🇸 United States
'Used to' doesn't live here anymore: you…
By:
Ted Daywalt
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🇺🇸 United States
Shanghai: the new Silicon Valley? A booming electronics ind…
By:
E. Jan Vardaman
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🇺🇸 United States
A critique of IPC-A-610E: a master trainer assesses the rev…
By:
Bob Wettermann
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🇺🇸 United States
Economic crisis to create a mobile-device contraction in 20…
By:
Gale Reference Team
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🇺🇸 United States
Back to basics: now more than ever, the need for quality in…
By:
Peter Bigelow
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🇺🇸 United States
Electronics residues testing methods; an analysis of four c…
By:
Gale Reference Team
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🇺🇸 United States
When to embed: advice on factors to consider and questions …
By:
Richard Snorgen
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🇺🇸 United States
How Much Protection Is Enough? -- Ask yourself these five q…
By:
Michael T. Brandt
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🇺🇸 United States
What's in a squeegee blade? In the SMT world, a whole …
By:
Rita Mohanty
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🇺🇸 United States
Thermal issues and properties of embedded resistors: a stud…
By:
Richard Snogren
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🇺🇸 United States
China: No. 2, with a bullet: forecasts call for 20% growth …
By:
Wang Longji
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🇺🇸 United States
Built for speed: think cost is king? When it comes to quick…
By:
Mike Buetow
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🇺🇸 United States
The ODM threat to EMS: after winning the motherboard market…
By:
Bill Coker
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🇺🇸 United States
Working with fabricators: tricks of the trade: designers, d…
By:
Tony Breglio, Jim Hellmer
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🇺🇸 United States
When a good DOE goes bad: estimate the time constant of a p…
By:
J. Lee Parker
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